
The spectromicroscopy (SM) facility at CLS has one beam line (10ID-1), enabling users to perform studies in the fields of polymer science, environmental science, and biological applications to novel material design and magnetic imaging.
CLS-SM consists of an Apple II Elliptically Polarizing Undulator (EPU), a plane grating monochromator (PGM), two branch lines, and two microscopes:
- Scanning Transmission X-ray Microscope (STXM)
- X-ray Photoemission Electron Microscope (X-PEEM)
List of Publications »
- Sun, Tianxiao; Wu, Bin; Deng, Shimao; Guo, Yu-Jie; Shi, Ji-Lei et al. (2025). Pinpointing Chemomechanical Origins of Na Cathode Degradation. Journal of the American Chemical Society 147(25) , 21375-21384. 10.1021/jacs.4c14571.
- Castle, Rielly; Appathurai, Narayan; Simonson, Nicholas; Sigari, Yasaman; Boland, Mark J. et al. (2025). Investigating the limits of hard X-ray coherence length measurement employing Young’s double slit experiment. Scientific Reports 15(1) . 10.1038/s41598-025-03295-y.
- Wang, Yuting; Jiang, Wei; Zhu, Keran; Yuan, Huasheng; Luo, Zhenlin et al. (2025). Rubber–Filler Interactions in Carbon Black-Filled Rubber Composites Studied by Scanning Transmission X-ray Microscopy. Journal of Physical Chemistry B 129(20) , 5047-5053. 10.1021/acs.jpcb.5c00494.
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