The spectromicroscopy (SM) facility at CLS has one beam line (10ID-1), enabling users to perform studies in the fields of polymer science, environmental science, and biological applications to novel material design and magnetic imaging.
CLS-SM consists of an Apple II Elliptically Polarizing Undulator (EPU), a plane grating monochromator (PGM), two branch lines, and two microscopes:
- Scanning Transmission X-ray Microscope (STXM)
- X-ray Photoemission Electron Microscope (X-PEEM)
List of Publications »
- Zhang, Chunyang; Ngunjiri, Robert; Gibson, Timothy M.; Li, Chenyu; Higgins, Drew et al. (2026). Watching copper catalysts evolve: Temporally resolved in situ scanning transmission X-ray microscopy during electrochemical CO₂ reduction. Electrochimica Acta 578, 150095. 10.1016/j.electacta.2026.150095.
- Dong, Yongqi; Zhu, Keran; Chen, Liang; Wang, Zimeng; Tong, Yajun et al. (2026). Design and Development of the Soft X-ray Ptychographic Nanoscopy Beamline at the Hefei Advanced Light Facility. Photon Science . 10.1021/photonsci.6c00047.
- Dutta, Animesh; Omessi, Saar; Feng, Renfei; Zhou, Jigang; Wang, Jian et al. (2026). Exposing the (110) Facet of Single-Crystal LiMn 2 O 4 Which Suppresses Surface Reconstruction and Enhances High-Temperature Cycling Stability. Journal of the Electrochemical Society 173(19) , 190509. 10.1149/1945-7111/aead2d.
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