The spectromicroscopy (SM) facility at CLS has one beam line (10ID-1), enabling users to perform studies in the fields of polymer science, environmental science, and biological applications to novel material design and magnetic imaging.
CLS-SM consists of an Apple II Elliptically Polarizing Undulator (EPU), a plane grating monochromator (PGM), two branch lines, and two microscopes:
- Scanning Transmission X-ray Microscope (STXM)
- X-ray Photoemission Electron Microscope (X-PEEM)
List of Publications »
- Prieto, E.R.; Sk, M.H.; Dwivedi, D.; Wang, J.; Barlow, B. et al. (2026). Comprehensive Near Edge X-ray Absorption Fine Structure analysis of corrosion in Iron at the nanoscale. Electrochimica Acta 574, 149358. 10.1016/j.electacta.2026.149358.
- Das, Sambhu Charan; Chen, Kuan‐Hung; Lin, Wei‐Xuan; Wang, Hsiao‐Tsu; Lee, Cheng‐En et al. (2026). Intrinsic Ferromagnetism and Surface Oxidation in Nb 2 FeC: Revealed by Synchrotron‐Based X‐Ray Spectro‐ and Microscopy. Advanced Electronic Materials . 10.1002/aelm.70534.
- Lytle, Spencer; Parmar, Harsharaj B.; Wang, Jian; Yamashita, Shohei; Bazylak, Aimy et al. (2026). Revealing the Nanoscale Morphology Changes of Polymer Electrolyte Membrane Fuel Cell Catalyst Layers due to Conditioning. Advanced Science . 10.1002/advs.77009.
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