The spectromicroscopy (SM) facility at CLS has one beam line (10ID-1), enabling users to perform studies in the fields of polymer science, environmental science, and biological applications to novel material design and magnetic imaging.
CLS-SM consists of an Apple II Elliptically Polarizing Undulator (EPU), a plane grating monochromator (PGM), two branch lines, and two microscopes:
- Scanning Transmission X-ray Microscope (STXM)
- X-ray Photoemission Electron Microscope (X-PEEM)
List of Publications »
- Prieto, E.R.; Sk, M.H.; Dwivedi, D.; Wang, J.; Barlow, B. et al. (2026). Comprehensive Near Edge X-ray Absorption Fine Structure analysis of corrosion in Iron at the nanoscale. Electrochimica Acta 574, 149358. 10.1016/j.electacta.2026.149358.
- Zhang, Chunyang; Ngunjiri, Robert; Beinik, Igor; Schwenke, Jörg; Thånell, Karina et al. (2026). Chemical and Morphological Changes of Chloride-Affected Cu Catalysts during CO 2 Reduction Studied by In Situ Scanning Transmission Soft X-ray Microscopy. Journal of Physical Chemistry C 130(22) , 7615-7627. 10.1021/acs.jpcc.6c01560.
- Das, Sambhu Charan; Chen, Kuan-Hung; Lin, Wei-Xuan; Wang, Hsiao-Tsu; Teng, Shu-Ang et al. (2026). Interfacial Robustness in Fe 2 TiO 5 /ZnO Core–Shell Nanodendrites Revealed by STXM-Ptychography for Enhanced Photoelectrochemical Performance. ACS Applied Materials and Interfaces 18(22) , 32011-32023. 10.1021/acsami.6c03568.
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